|TRIZ Case Study: Japan TRIZ Symposium 2008 Presentation|
|Test Pogo Pin (Gold Pins) Reuse Program|
|Paul Devaraj, Si Wai Chiang (Intel, Malaysia)|
|The Fourth TRIZ Symposium in Japan, Held by Japan TRIZ Society on Sept. 10-12, 2008 at Laforet Biwako, Moriyama, Shiga, Japan|
|Introduction by Toru Nakagawa (Osaka Gakuin Univ.), Oct. 26, 2008|
|[Posted on July 10, 2009]|
For going back to Japanese pages, press buttons.
Editor's Note (Toru Nakagawa, Jul. 9, 2009)
This paper was presented at the Fourth TRIZ Symposium in Japan, 2008 , which was held last September by 'Japan TRIZ Society, NPO'. This is one of the four case study presentations given by Intel at the Symposium, besides the Keynote Lecture provided by Amir Roggel (Intel, Israel). With these presentations you may be able to understand how the global innovation company uses TRIZ for their real projects and businesses.
Japan TRIZ Society has posted the presentation files (in Japanese) of all the Contributed Presentations in the 'Members-Only' area of its Official Web site (http://www.triz-japan.org/ ) in PDF on July 1, 2009. Files in English are going to be posted in a similar way.
The present site, "TRIZ Home Page in Japan", on the other hand, is going to post several selected Contributed Presentations publicly, under the desire & permisson by the Authors. Presentation slides of them will be posted in PDF, with the policy of updating prohibited, copying and printing permitted.
This page has the following contents in English and in Japanese:
Item English page Japanese page Abstract of the paper (HTML) Abstract -- Presentation slides (PDF) (27 slides, 1.9 MB) (27 slides 2.1 MB)
(Japanese translation by Kazumasa Yokoyama (Toshiba))
Introduction by Nakagawa: An excerpt from "Personal Report of Japan TRIZ Symposium 2008" (HTML) Nakagawa Introduction --
Test Pogo Pin (Gold Pins) Reuse Program
Paul Devaraj, Si Wai Chiang (Intel, Malaysia)
In today’s highly competitive environment, Operation Cost seems to be the defining factor that decides between the success or failure of any given operation. This is even true in the case of Test Operation. One of the biggest pie in Test Cost stems from the cost of maintaining the test Interface Unit (TIU) of which the Pogo Pins are the biggest contributors. Over the Years, Semi-conductor Test Operations throughout the industry has poured millions of dollars per Annum of their Test operation budget into purchasing of these tinny pieces of Gold pins. This paper discusses a key endeavor to reduce significant amount of that cost without jeopardizing Quality or safety through a Reuse or recycle effort.
 Presentation Slides in PDF
Presentation Slides in English in PDF (27 slides, 1.9 MB)
Presentation Slides in Japanese in PDF (27 slides, 2.1 MB)
 Introduction to the Presentation (by Nakagawa)
Personal Report of The Fourth TRIZ Symposium in Japan, 2008
by Toru Nakagawa (Osaka Gakuin University), Oct. 26, 2008
Posted on Oct. 26, 2008 in "TRIZ Home Page in Japan"
Paul Devaraj and Si, Wai Chiang (Intel, Malaysia) [O-2 #02] gave an Oral presentation with the title of "Test Pogo Pins (Gold Pins) Reuse Program". (Due to double tracks, I missed this presentation.) The factory at Penang City in Malaysia is dedicated to testing. The general background of their jobs is shown in the following two slides.
The specific problem addressed in this presentation is shown below. The problem, originally stated as the high test cost due to Pogo pins (made of gold for good electrical contact), is focused on 'short pin life and huge quantities of pins per socket'.
The use of Su-Field Model has suggested the basic direction of solution as shown in the slide (see right). The current problem is the High pin replacement cost. The basic direction which the Authors have chosen is to introduce a Reuse Pin Process, which should reduce the pin replacement cost. We should note the Authors' comment written as "Incremental Innovation is MOST WELCOME!".
In this direction, the Authors generated a solution concept of the Reuse Process consisted of 4 steps (see below left), then further revised the solution process by merging the first and the second steps. Thus they obtained an idea to make their original tool for this process, named 'Test Contractor Characterization Tool (TCCT)'.
Thus the Authors designed their original in-company tool, TCCT. And in designing TCCT they have applied TRIZ again in various points. One of their TRIZ applications is shown here. Since there are a number of different types of Test Contactors, the product plate to hold the test contactor need to be different and replaceable at first thought. But the TRIZ principle Universality suggested to make the Product plate universally adjustable, as shown in the slide.
The Authors show the tools of TRIZ used in Intel in the slide. The asterisks * are the specific tools in the present case study. You see that all these tools are standard ones in TRIZ. People in Intel seem to utilize these orthodox TRIZ tools for solving problems in their real jobs.
The Authors conclude their presentation with the evaluation of their results in terms of the business benefits obtained (or to be obtained).
|Top of this page||Abstract||Slides in PDF||Nakagawa's Introduction||Japan TRIZ Symp. 2008||Nakagawa's Personal Report of Japan TRIZ Symp. 2008||Japanese page|
|General index||New Information||Introduction to TRIZ||TRIZ References||TRIZ Links||TRIZ News & Activities||TRIZ Software Tools||TRIZ Papers and Tech Reports>||TRIZ Lectures||TRIZ Forum||General index|
|Home Page||New Information||Introduction to TRIZ||TRIZ References||TRIZ Links||TRIZ News & Activities>||TRIZ Software Tools||TRIZ Papers and Tech Reports||TRIZ Lectures||TRIZ Forum||Home Page|
Last updated on Jul. 10, 2009. Access point: Editor: email@example.com