Simplifying Conversion and Enhancing Outgoing Product Quality on the ICOS Vision System with TRIZ | |
Darin Moreira, Sushiph Sum Bun, CT Ong (Intel Malaysia) | |
The Fifth TRIZ Symposium in Japan, Held by Japan TRIZ Society on Sept. 10-12, 2009 at National Women's Education Center, Ranzan-machi, Hiki-gun, Saitama, Japan | |
Japanese translation of slides by Kozo Nakahata (Hitachi), Introduction by Toru Nakagawa (Osaka Gakuin Univ.), Nov. 28, 2009 |
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[Posted on Sept. 23, 2010] |
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Editor's Note (Toru Nakagawa, Jun. 30, 2010)
This is one of the four real case study papers presented by Intel Malaysia last year at the 5th TRIZ Symposium in Japan, 2009. It was presented in a Poster Session.
The present paper written by Darin Moreira et al. reports a problem solving in making the conversion easier in the ICOS vision system. The problem and its solution are described clearly with photos of the real equipment. We are grateful to Intel Corporation for such frankness in disclosing the case.
This page is composed as follows:
[1] Abstract
[2] Presentation slides in English in PDF
,
Presentation slides in Japanese translation by Kozo Nakahata in PDF[3] Nakagawa's introduction in English (Excerpt from "Personal Report of Japan TRIZ Symposium 2009")
Top of this page | Abstract | Presentation slides |
Presentation slides in Japanese |
Nakagawa's Introduction | Nakagawa's Personal Report |
Japan TRIZ Symposium 2009 |
Japanese page |
[1] Abstract
Simplifying Conversion and Enhancing Outgoing Product Quality
on the ICOS Vision System with TRIZDarin Moreira, Sushiph Sum Bun, CT Ong (Intel Malaysia)
Abstract
The ICOS module is the final screening gate for cosmetic defects at the factory prior to going out to the customers. Being a HMLV (High Mix Low Volume) factory, there is a big pool of different dimension products that will be screened. Long conversion time and conversion related downtime has been a big problem that has been gating the factory output and on top of that a concerning number of customer complaints which root cause originate from the conversion on the ICOS itself. TRIZ enabled the reduction of downtime by 50% and at the same time minimized the conversion time by 35% that eventually returned more than anticipated.
[2] Presentation Slides in PDF
Presentation Slides in English in PDF
(11 slides, 380 KB)
Presentation Slides in Japanese in PDF
(11 slides, 267 KB) (Japanese translation by Kozo Nakahata (Hitachi
[3] Introduction to the Presentation (by Nakagawa)
Excerpt from:
Personal Report of The Fifth TRIZ Symposium in Japan, 2009, Part D. Case Studies in Industries
by Toru Nakagawa (Osaka Gakuin University), Nov. 28, 2009
Posted on Dec. 4, 2009 in "TRIZ Home Page in Japan"
Darin Moreira, Sushiph Sum Bun, CT Ong (Intel, Malaysia) [E02 P-A6] gave a Poster presentation on "Simplifying Conventional and Enhancing Outgoing Product Quality on the ICOS Vision System with TRIZ". The Authors' Abstract is quoted here first:
The ICOS module is the final screening gate for cosmetic defects at the factory prior to going out to the customers. Being a HMLV (High Mix Low Volume) factory, there is a big pool of different dimension products that will be screened. Long conversion time and conversion related downtime has been a big problem that has been gating the factory output and on top of that a concerning number of customer complaints which root cause originate from the conversion on the ICOS itself. TRIZ enabled the reduction of downtime by 50% and at the same time minimized the conversion time by 35% that eventually returned more than anticipated.
The problem is stated in the slide (below-left) and its detailed examples are shown with the pictures of the equipment (slide below-right).
The Authors' TRIZ team applied their standard methods of TRIZ Toolbox, including the Functional analysis, 40 Inventive Principles, and Trimming. As the results they obtained the solution ideas and implemented them in their equipment. The changes they actually made are demonstrated with the detailed pictures of their real equipment. Inventive Principles such as Merging, Segmenting, and Feedback were used as the guidelines of these solutions.
[*** We are thankful to the Authors and Intel Corp. for their publicly showing us these detailed pictures of solution examples. This also shows the advantage of revising and improving the own instruments for oneselves.]The results of the TRIZ application project and its impacts on the job processes are shown in the slide (below-left). The Key Lessons learnt are summarized in the slide (below-right).
Top of this page | Abstract | Presentation slides |
Presentation slides in Japanese |
Nakagawa's Introduction | Nakagawa's Personal Report |
Japan TRIZ Symposium 2009 |
Japanese page |
Last updated on Sept. 23, 2010. Access point: Editor: nakagawa@ogu.ac.jp